Publikation:

Electron Conductivity on Helium Films

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2008

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Klier, Jürgen
Doicescu, Irena
Shikin, Valeri

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Journal of Low Temperature Physics. 2008, 150(3/4), pp. 212-223. ISSN 0022-2291. eISSN 1573-7357. Available under: doi: 10.1007/s10909-007-9537-0

Zusammenfassung

Electrons on liquid helium films form a two-dimensional (2D) array with a wide range of electron density. This system is also very interesting for applications in restricted geometry. The conductivity σ of the electron arrays, however, strongly depends on the thickness d of the helium films adsorbed above solid substrates. This behaviour of σ is discussed in detail for a randomly rough substrate. It turns out that for the dependence of the conductivity σ(d) there exist three regions of helium thicknesses: d > dmin, d ∼ dmin, and d < dmin. Here dmin is the helium film thickness which corresponds to a relatively deep minimum of the 2D conductivity. In the first interval, d > dmin, a two-fraction scenario determines the behaviour of σ(d). In the vicinity of dmin percolation phenomena develop and the conductivity exhibits different types of the so-called dip effect. For even thinner helium films, i.e., when d < dmin, an activation type of mobility is stimulated. The presented model fits quite well to existing data of ac and dc electron mobility.

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530 Physik

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2D electron systems, Thin helium films, Electronic transport, Surface roughness

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ISO 690KLIER, Jürgen, Irena DOICESCU, Paul LEIDERER, Valeri SHIKIN, 2008. Electron Conductivity on Helium Films. In: Journal of Low Temperature Physics. 2008, 150(3/4), pp. 212-223. ISSN 0022-2291. eISSN 1573-7357. Available under: doi: 10.1007/s10909-007-9537-0
BibTex
@article{Klier2008Elect-5357,
  year={2008},
  doi={10.1007/s10909-007-9537-0},
  title={Electron Conductivity on Helium Films},
  number={3/4},
  volume={150},
  issn={0022-2291},
  journal={Journal of Low Temperature Physics},
  pages={212--223},
  author={Klier, Jürgen and Doicescu, Irena and Leiderer, Paul and Shikin, Valeri}
}
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