Publikation:

Scanning probe microscopy and spectroscopy of graphene on metals

Vorschaubild

Dateien

Zu diesem Dokument gibt es keine Dateien.

Datum

2015

Autor:innen

Voloshina, Elena

Herausgeber:innen

Kontakt

ISSN der Zeitschrift

Electronic ISSN

ISBN

Bibliografische Daten

Verlag

Schriftenreihe

Auflagebezeichnung

URI (zitierfähiger Link)
DOI (zitierfähiger Link)
https://doi.org/10.1002/pssb.201570315
ArXiv-ID

Internationale Patentnummer

Angaben zur Forschungsförderung

Projekt

Open Access-Veröffentlichung

Sammlungen

Physik: Publikationen
Core Facility der Universität Konstanz

Gesperrt bis

Titel in einer weiteren Sprache

Publikationstyp
Zeitschriftenartikel
Publikationsstatus
Published

Erschienen in

physica status solidi (b). 2015, 252(3), pp. 451-468. ISSN 0370-1972. eISSN 1521-3951. Available under: doi: 10.1002/pssb.201570315

Zusammenfassung

Graphene, a two-dimensional (2D) material with unique electronic properties, appears to be an ideal object for the application of surface-science methods. Among them, a family of scanning probe microscopy methods (STM, AFM, KPFM) and the corresponding spectroscopy add-ons provide information about the structure and electronic properties of graphene on the local scale (from µm to atoms). This review focuses on the recent applications of these microscopic/spectroscopic methods for the investigation of graphene on metals (interfaces, intercalation-like systems, graphene nanoribbons, and quantum dots, etc.). It is shown that very important information about interaction strength at the graphene/metal interfaces as well as about modification of the electronic spectrum of graphene at the Fermi level can be obtained on the local scale. The combination of these results with those obtained by other methods and comparison with recent theoretical data demonstrate the power of this approach for the investigation of the graphene-based systems.

Zusammenfassung in einer weiteren Sprache

Fachgebiet (DDC)
530 Physik

Schlagwörter

atomic force microscopy, density functional theory, graphene, metal surfaces, scanning tunneling microscopy

Konferenz

Rezension
undefined / . - undefined, undefined

Forschungsvorhaben

Organisationseinheiten

Zeitschriftenheft

Zugehörige Datensätze in KOPS

Zitieren

ISO 690DEDKOV, Yuriy S., Elena VOLOSHINA, Mikhail FONIN, 2015. Scanning probe microscopy and spectroscopy of graphene on metals. In: physica status solidi (b). 2015, 252(3), pp. 451-468. ISSN 0370-1972. eISSN 1521-3951. Available under: doi: 10.1002/pssb.201570315
BibTex
@article{Dedkov2015Scann-31396,
  year={2015},
  doi={10.1002/pssb.201570315},
  title={Scanning probe microscopy and spectroscopy of graphene on metals},
  number={3},
  volume={252},
  issn={0370-1972},
  journal={physica status solidi (b)},
  pages={451--468},
  author={Dedkov, Yuriy S. and Voloshina, Elena and Fonin, Mikhail}
}
RDF
<rdf:RDF
    xmlns:dcterms="http://purl.org/dc/terms/"
    xmlns:dc="http://purl.org/dc/elements/1.1/"
    xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
    xmlns:bibo="http://purl.org/ontology/bibo/"
    xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
    xmlns:foaf="http://xmlns.com/foaf/0.1/"
    xmlns:void="http://rdfs.org/ns/void#"
    xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > 
  <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/31396">
    <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
    <dc:contributor>Fonin, Mikhail</dc:contributor>
    <dc:language>eng</dc:language>
    <dc:creator>Dedkov, Yuriy S.</dc:creator>
    <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dc:contributor>Voloshina, Elena</dc:contributor>
    <dcterms:title>Scanning probe microscopy and spectroscopy of graphene on metals</dcterms:title>
    <dc:creator>Voloshina, Elena</dc:creator>
    <dcterms:issued>2015</dcterms:issued>
    <dc:contributor>Dedkov, Yuriy S.</dc:contributor>
    <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2015-07-08T09:53:13Z</dc:date>
    <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2015-07-08T09:53:13Z</dcterms:available>
    <foaf:homepage rdf:resource="http://localhost:8080/"/>
    <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dc:creator>Fonin, Mikhail</dc:creator>
    <dcterms:abstract xml:lang="eng">Graphene, a two-dimensional (2D) material with unique electronic properties, appears to be an ideal object for the application of surface-science methods. Among them, a family of scanning probe microscopy methods (STM, AFM, KPFM) and the corresponding spectroscopy add-ons provide information about the structure and electronic properties of graphene on the local scale (from µm to atoms). This review focuses on the recent applications of these microscopic/spectroscopic methods for the investigation of graphene on metals (interfaces, intercalation-like systems, graphene nanoribbons, and quantum dots, etc.). It is shown that very important information about interaction strength at the graphene/metal interfaces as well as about modification of the electronic spectrum of graphene at the Fermi level can be obtained on the local scale. The combination of these results with those obtained by other methods and comparison with recent theoretical data demonstrate the power of this approach for the investigation of the graphene-based systems.</dcterms:abstract>
    <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/31396"/>
  </rdf:Description>
</rdf:RDF>

Interner Vermerk

xmlui.Submission.submit.DescribeStep.inputForms.label.kops_note_fromSubmitter

Kontakt
URL der Originalveröffentl.

Prüfdatum der URL

Prüfungsdatum der Dissertation

Finanzierungsart

Kommentar zur Publikation

Allianzlizenz
Corresponding Authors der Uni Konstanz vorhanden
Internationale Co-Autor:innen
Universitätsbibliographie
Ja
Begutachtet
Diese Publikation teilen