20% Efficient 80 µm Thin Industrial-Type Large-Area Solar Cells from 100 µm Sawn c-Si Wafers
20% Efficient 80 µm Thin Industrial-Type Large-Area Solar Cells from 100 µm Sawn c-Si Wafers
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2015
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IEEE 42nd Photovoltaic Specialist Conference (PVSC). Piscataway, NJ: IEEE Service Center, 2015. ISBN 978-1-4799-7944-8. Available under: doi: 10.1109/PVSC.2015.7356220
Zusammenfassung
Reducing the thickness of crystalline Si wafers to be processed into solar cells yields several significant benefits: PV module manufacturing cost can be reduced and the required diffusion length of minority carriers is smaller. The latter in turn enables a higher efficiency potential and a larger spread of Si materials to be employed for rear junction solar cell concepts which are advantageous for n-type devices. Industrial-type 80 μm thin large-area rear junction solar cells manufactured from 100 μm wire-sawn wafers exhibit an independently certified efficiency of 20.1% with VOC of 672 mV.
Zusammenfassung in einer weiteren Sprache
Fachgebiet (DDC)
530 Physik
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boron, n-type, photovoltaic cells, selective, silicon, thin wafers
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IEEE 42nd Photovoltaic Specialist Conference (PVSC), 14. Juni 2015 - 19. Juni 2015, New Orleans
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SCHIELE, Yvonne, Nils H. BRINKMANN, Jan EBSER, Renate HORBELT, Alexander FREY, Josh ENGELHARDT, Giso HAHN, Barbara TERHEIDEN, 2015. >20% Efficient 80 µm Thin Industrial-Type Large-Area Solar Cells from 100 µm Sawn c-Si Wafers. IEEE 42nd Photovoltaic Specialist Conference (PVSC). New Orleans, 14. Juni 2015 - 19. Juni 2015. In: IEEE 42nd Photovoltaic Specialist Conference (PVSC). Piscataway, NJ: IEEE Service Center, 2015. ISBN 978-1-4799-7944-8. Available under: doi: 10.1109/PVSC.2015.7356220BibTex
@inproceedings{Schiele2015Effic-39709, year={2015}, doi={10.1109/PVSC.2015.7356220}, title={>20% Efficient 80 µm Thin Industrial-Type Large-Area Solar Cells from 100 µm Sawn c-Si Wafers}, isbn={978-1-4799-7944-8}, publisher={IEEE Service Center}, address={Piscataway, NJ}, booktitle={IEEE 42nd Photovoltaic Specialist Conference (PVSC)}, author={Schiele, Yvonne and Brinkmann, Nils H. and Ebser, Jan and Horbelt, Renate and Frey, Alexander and Engelhardt, Josh and Hahn, Giso and Terheiden, Barbara} }
RDF
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