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Large area n-type silicon solar cells with selective front surface field and screen printed aluminium-alloyed rear emitter

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Book_160178.pdf
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2010

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Published

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DE SANTI, G.F., ed., H. OSSENBRINK, ed., P. HELM, ed.. 25th European Photovoltaic Solar Energy Conference and Exhibition. 5th World Conference on photovoltaic Energy Conversion. Munich, Germany: WIP-Renewable Energies, 2010, pp. 1465-1468. Available under: doi: 10.4229/25thEUPVSEC2010-2DO.2.6

Zusammenfassung

Large area n-type silicon solar cells with a screen-printed aluminum rear side emitter are mainly limited by their front surface recombination velocity. In order to overcome this limitation, we use an industrially applicable etch-back process to create a selective front surface field (s-FSF). This process was developed for the formation of a single diffusion selective emitter on p-type silicon; it generates a deep doping profile with a low surface concentration which results in an excellent emitter saturation current and a highest independently confirmed stable cell efficiency of 18.7% on 5” p-type Cz silicon. In this work we focus on the applicability of this process to n-type silicon. 6” solar cells with different front side etchback depths have been processed from n-type silicon leading to a highest efficiency of 18.5% for a s-FSF cell and an average gain of 0.8%abs compared to cells with a homogeneous FSF. We furthermore investigate the quality of the etch-back FSF and the screen printed alloyed emitter from different pastes by QSSPC measurements.

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Fachgebiet (DDC)
530 Physik

Schlagwörter

etching, selective emitter, n-Type

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25th European Photovoltaic Solar Energy Conference and Exhibition. 5th World Conference on photovoltaic Energy Conversion, 6. Sept. 2010 - 10. Sept. 2010, Valencia, Spain
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ISO 690BOOK, Felix, Thomas WIEDENMANN, Amir DASTGHEIB-SHIRAZI, Bernd RAABE, Giso HAHN, 2010. Large area n-type silicon solar cells with selective front surface field and screen printed aluminium-alloyed rear emitter. 25th European Photovoltaic Solar Energy Conference and Exhibition. 5th World Conference on photovoltaic Energy Conversion. Valencia, Spain, 6. Sept. 2010 - 10. Sept. 2010. In: DE SANTI, G.F., ed., H. OSSENBRINK, ed., P. HELM, ed.. 25th European Photovoltaic Solar Energy Conference and Exhibition. 5th World Conference on photovoltaic Energy Conversion. Munich, Germany: WIP-Renewable Energies, 2010, pp. 1465-1468. Available under: doi: 10.4229/25thEUPVSEC2010-2DO.2.6
BibTex
@inproceedings{Book2010Large-16017,
  year={2010},
  doi={10.4229/25thEUPVSEC2010-2DO.2.6},
  title={Large area n-type silicon solar cells with selective front surface field and screen printed aluminium-alloyed rear emitter},
  publisher={WIP-Renewable Energies},
  address={Munich, Germany},
  booktitle={25th European Photovoltaic Solar Energy Conference and Exhibition. 5th World Conference on photovoltaic Energy Conversion},
  pages={1465--1468},
  editor={de Santi, G.F. and Ossenbrink, H. and Helm, P.},
  author={Book, Felix and Wiedenmann, Thomas and Dastgheib-Shirazi, Amir and Raabe, Bernd and Hahn, Giso}
}
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    <dcterms:abstract xml:lang="eng">Large area n-type silicon solar cells with a screen-printed aluminum rear side emitter are mainly limited by their front surface recombination velocity. In order to overcome this limitation, we use an industrially applicable etch-back process to create a selective front surface field (s-FSF). This process was developed for the formation of a single diffusion selective emitter on p-type silicon; it generates a deep doping profile with a low surface concentration which results in an excellent emitter saturation current and a highest independently confirmed stable cell efficiency of 18.7% on 5” p-type Cz silicon. In this work we focus on the applicability of this process to n-type silicon. 6” solar cells with different front side etchback depths have been processed from n-type silicon leading to a highest efficiency of 18.5% for a s-FSF cell and an average gain of 0.8%abs compared to cells with a homogeneous FSF. We furthermore investigate the quality of the etch-back FSF and the screen printed alloyed emitter from different pastes by QSSPC measurements.</dcterms:abstract>
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