Publikation: A high-resolution time-of-flight energy analyzer for femtosecond electron pulses at 30 keV
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We report a time-of-flight spectrometer for electron pulses at up to 30 keV, which is a suitable energy for atomic-resolution femtosecond investigations via time-resolved electron diffraction, microscopy, and energy loss spectroscopy. For realistic femtosecond beams without apertures, the instrument's energy resolution is ∼0.5 eV (full width at half maximum) or 2 × 10(-5) at a throughput of 50%-90%. We demonstrate the analyzer's versatility by three first applications, namely, femtosecond electron pulse metrology via optical streaking, in situ drift correction in laser-microwave synchronization for electron pulse compression, and time-resolved electron energy loss spectroscopy of aluminum, showing the instrument's capability of tracking plasmonic loss peak positions with few-meV accuracy.
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GLISERIN, Alexander, Matthew WALBRAN, Peter BAUM, 2016. A high-resolution time-of-flight energy analyzer for femtosecond electron pulses at 30 keV. In: Review of Scientific Instruments. 2016, 87(3), pp. 033302. ISSN 0034-6748. eISSN 1089-7623. Available under: doi: 10.1063/1.4942912BibTex
@article{Gliserin2016-03highr-43263,
year={2016},
doi={10.1063/1.4942912},
title={A high-resolution time-of-flight energy analyzer for femtosecond electron pulses at 30 keV},
number={3},
volume={87},
issn={0034-6748},
journal={Review of Scientific Instruments},
author={Gliserin, Alexander and Walbran, Matthew and Baum, Peter}
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<dcterms:abstract xml:lang="eng">We report a time-of-flight spectrometer for electron pulses at up to 30 keV, which is a suitable energy for atomic-resolution femtosecond investigations via time-resolved electron diffraction, microscopy, and energy loss spectroscopy. For realistic femtosecond beams without apertures, the instrument's energy resolution is ∼0.5 eV (full width at half maximum) or 2 × 10(-5) at a throughput of 50%-90%. We demonstrate the analyzer's versatility by three first applications, namely, femtosecond electron pulse metrology via optical streaking, in situ drift correction in laser-microwave synchronization for electron pulse compression, and time-resolved electron energy loss spectroscopy of aluminum, showing the instrument's capability of tracking plasmonic loss peak positions with few-meV accuracy.</dcterms:abstract>
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