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Phase contrast surface mode resonance microscopy

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150_opticcommun_1994.pdf
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1994

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Herminghaus, Stephan
Petersen, W.

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Optics Communications. 1994, 112, pp. 16-20. Available under: doi: 10.1016/0030-4018(94)90072-8

Zusammenfassung

A simple method is described which allows to obtain a phase sensitive image in surface mode resonance microscopy. It exploits the fact that surface mode resonances couple only to one dimtion of polarization (s or p) so that the other direction (p or s) can be used as a reference wave. Using a SoleiI-Babinet compensator and a polarizet, the two waves can be phase shifted with respect to each other and superimposed before they are imaged onto a camem chip. The method is demonstrated experimentally. Possible applications are discussed, especiaIly for the field of nonlinear optics of thin films and surfaces, where phase information is particularly desirable.

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530 Physik

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ISO 690HERMINGHAUS, Stephan, Clemens BECHINGER, W. PETERSEN, Paul LEIDERER, 1994. Phase contrast surface mode resonance microscopy. In: Optics Communications. 1994, 112, pp. 16-20. Available under: doi: 10.1016/0030-4018(94)90072-8
BibTex
@article{Herminghaus1994Phase-9451,
  year={1994},
  doi={10.1016/0030-4018(94)90072-8},
  title={Phase contrast surface mode resonance microscopy},
  volume={112},
  journal={Optics Communications},
  pages={16--20},
  author={Herminghaus, Stephan and Bechinger, Clemens and Petersen, W. and Leiderer, Paul}
}
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