Shunt Detection With Illuminated Lock-In Thermography on Inline Relevant Time Scales

Kurzanzeige
dc.contributor.authorSeren, Sven
dc.contributor.authorKaes, Martindeu
dc.contributor.authorHahn, Giso
dc.contributor.authorNagel, H.deu
dc.date.accessioned2011-03-22T17:51:52Zdeu
dc.date.available2011-03-22T17:51:52Zdeu
dc.date.issued2008deu
dc.description.abstractThe focus of this paper is on the fast spatially resolved detection of conversion efficiency limiting shunts in solar cells. These shunt producing defects can originate either from the wafer material itself or can be formed during solar cell processing. Such heat dissipating defects can be detected easily using the Lock-In Thermography technique. By improving the thermal resolution by means of lowering the Lock-In frequency the measurement time can be reduced significantly. Such fast illuminated Lock-In Thermography (iLIT) measurements allow the detection of local shunts spatially resolved within a measurement time of only one second. For different shunting mechanisms such as material induced defects as well as processing induced shunts fast iLIT measurements are presented and demonstrate that the considered shunting types can be reliably detected within a time interval relevant for inline characterisation.eng
dc.description.versionpublished
dc.identifier.citationPubl. in: The compiled state-of-the-art of PV solar technology and deployment : 23rd European Photovoltaic Solar Energy Conference, EU PVSEC, Valencia, Spain, 1 - 5 September 2008 ; proceedings / Ed. by: D. Lincot ... Munich : WIP-Renewable Energies, 2008, pp. 1746-1748deu
dc.identifier.ppn510214134
dc.identifier.urihttp://kops.uni-konstanz.de/handle/123456789/909
dc.language.isoengdeu
dc.legacy.dateIssued2010deu
dc.rightsterms-of-use
dc.rights.urihttps://rightsstatements.org/page/InC/1.0/
dc.subject.ddc530deu
dc.titleShunt Detection With Illuminated Lock-In Thermography on Inline Relevant Time Scaleseng
dc.typeINPROCEEDINGSdeu
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@inproceedings{Seren2008Shunt-909,
  year={2008},
  title={Shunt Detection With Illuminated Lock-In Thermography on Inline Relevant Time Scales},
  publisher={WIP-Renewable Energies},
  address={Munich},
  booktitle={The compiled state-of-the-art of PV solar technology and deployment  :  23rd European Photovoltaic Solar Energy Conference, EU PVSEC, Valencia, Spain, 1 - 5 September 2008  ;  proceedings},
  pages={1746--1748},
  editor={Lincot, D.},
  author={Seren, Sven and Kaes, Martin and Hahn, Giso and Nagel, H.}
}
kops.citation.iso690SEREN, Sven, Martin KAES, Giso HAHN, H. NAGEL, 2008. Shunt Detection With Illuminated Lock-In Thermography on Inline Relevant Time Scales. In: LINCOT, D., ed. and others. The compiled state-of-the-art of PV solar technology and deployment : 23rd European Photovoltaic Solar Energy Conference, EU PVSEC, Valencia, Spain, 1 - 5 September 2008 ; proceedings. Munich: WIP-Renewable Energies, 2008, pp. 1746-1748deu
kops.citation.iso690SEREN, Sven, Martin KAES, Giso HAHN, H. NAGEL, 2008. Shunt Detection With Illuminated Lock-In Thermography on Inline Relevant Time Scales. In: LINCOT, D., ed. and others. The compiled state-of-the-art of PV solar technology and deployment : 23rd European Photovoltaic Solar Energy Conference, EU PVSEC, Valencia, Spain, 1 - 5 September 2008 ; proceedings. Munich: WIP-Renewable Energies, 2008, pp. 1746-1748eng
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kops.sourcefieldLINCOT, D., ed. and others. <i>The compiled state-of-the-art of PV solar technology and deployment : 23rd European Photovoltaic Solar Energy Conference, EU PVSEC, Valencia, Spain, 1 - 5 September 2008 ; proceedings</i>. Munich: WIP-Renewable Energies, 2008, pp. 1746-1748deu
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kops.sourcefield.plainLINCOT, D., ed. and others. The compiled state-of-the-art of PV solar technology and deployment : 23rd European Photovoltaic Solar Energy Conference, EU PVSEC, Valencia, Spain, 1 - 5 September 2008 ; proceedings. Munich: WIP-Renewable Energies, 2008, pp. 1746-1748eng
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source.titleThe compiled state-of-the-art of PV solar technology and deployment : 23rd European Photovoltaic Solar Energy Conference, EU PVSEC, Valencia, Spain, 1 - 5 September 2008 ; proceedings

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