Extraction of individual components of series resistance using TCAD simulations meeting the requirements of 2- and 3-dimensional carrier flow of IBC solar cells

Lade...
Vorschaubild
Dateien
Micard_2-fko3dd2vu2z21.pdf
Micard_2-fko3dd2vu2z21.pdfGröße: 985.88 KBDownloads: 304
Datum
2017
Herausgeber:innen
Kontakt
ISSN der Zeitschrift
Electronic ISSN
ISBN
Bibliografische Daten
Verlag
Schriftenreihe
Auflagebezeichnung
ArXiv-ID
Internationale Patentnummer
Angaben zur Forschungsförderung
Projekt
Open Access-Veröffentlichung
Open Access Green
Sammlungen
Core Facility der Universität Konstanz
Gesperrt bis
Titel in einer weiteren Sprache
Forschungsvorhaben
Organisationseinheiten
Zeitschriftenheft
Publikationstyp
Beitrag zu einem Konferenzband
Publikationsstatus
Published
Erschienen in
PREU, Ralf, ed.. 7th International Conference on Silicon Photovoltaics, SiliconPV 2017, 3-5 April 2017, Freiburg, Germany. Amsterdam: Elsevier, 2017, pp. 113-119. Energy Procedia. 124. eISSN 1876-6102. Available under: doi: 10.1016/j.egypro.2017.09.325
Zusammenfassung

The series resistance (RS) of a solar cell, that influences fill factor and thus efficiency, is usually decomposed into individual components for development of optimization strategies. In this contribution we introduce a method to extract Rs of each part of the solar cell from TCAD simulation using free energy loss analysis. This method is particularly relevant for modern cell concepts where only TCAD simulation describes correctly high injection phenomena in lowly doped wafers, and where 2- or 3-dimensional carrier flow occurs (PERC, PERT, IBC) invalidating the classical analytical models for Rs description. We compare the lumped RS value extracted from the FELA to the RS extracted from the Multiple Light Intensity Method (MLIM) for IBC solar cells with various geometries and wafer doping levels, with and without a front surface field, and show that it is quite accurate even when high injection phenomena induce a slight underestimation of RS.

Zusammenfassung in einer weiteren Sprache
Fachgebiet (DDC)
530 Physik
Schlagwörter
Series resistance; IBC solar cells; TCAD simulation
Konferenz
7th International Conference on Silicon Photovoltaics, SiliconPV 2017, 3. Apr. 2017 - 5. Apr. 2017, Freiburg
Rezension
undefined / . - undefined, undefined
Zitieren
ISO 690MICARD, Gabriel, Daniel SOMMER, Giso HAHN, Barbara TERHEIDEN, 2017. Extraction of individual components of series resistance using TCAD simulations meeting the requirements of 2- and 3-dimensional carrier flow of IBC solar cells. 7th International Conference on Silicon Photovoltaics, SiliconPV 2017. Freiburg, 3. Apr. 2017 - 5. Apr. 2017. In: PREU, Ralf, ed.. 7th International Conference on Silicon Photovoltaics, SiliconPV 2017, 3-5 April 2017, Freiburg, Germany. Amsterdam: Elsevier, 2017, pp. 113-119. Energy Procedia. 124. eISSN 1876-6102. Available under: doi: 10.1016/j.egypro.2017.09.325
BibTex
@inproceedings{Micard2017Extra-41738,
  year={2017},
  doi={10.1016/j.egypro.2017.09.325},
  title={Extraction of individual components of series resistance using TCAD simulations meeting the requirements of 2- and 3-dimensional carrier flow of IBC solar cells},
  number={124},
  publisher={Elsevier},
  address={Amsterdam},
  series={Energy Procedia},
  booktitle={7th International Conference on Silicon Photovoltaics, SiliconPV 2017, 3-5 April 2017, Freiburg, Germany},
  pages={113--119},
  editor={Preu, Ralf},
  author={Micard, Gabriel and Sommer, Daniel and Hahn, Giso and Terheiden, Barbara}
}
RDF
<rdf:RDF
    xmlns:dcterms="http://purl.org/dc/terms/"
    xmlns:dc="http://purl.org/dc/elements/1.1/"
    xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#"
    xmlns:bibo="http://purl.org/ontology/bibo/"
    xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#"
    xmlns:foaf="http://xmlns.com/foaf/0.1/"
    xmlns:void="http://rdfs.org/ns/void#"
    xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > 
  <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41738">
    <dcterms:issued>2017</dcterms:issued>
    <dc:creator>Micard, Gabriel</dc:creator>
    <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dspace:hasBitstream rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/41738/3/Micard_2-fko3dd2vu2z21.pdf"/>
    <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2018-03-09T12:11:22Z</dc:date>
    <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2018-03-09T12:11:22Z</dcterms:available>
    <dc:contributor>Sommer, Daniel</dc:contributor>
    <dc:creator>Hahn, Giso</dc:creator>
    <dc:creator>Sommer, Daniel</dc:creator>
    <dcterms:title>Extraction of individual components of series resistance using TCAD simulations meeting the requirements of 2- and 3-dimensional carrier flow of IBC solar cells</dcterms:title>
    <foaf:homepage rdf:resource="http://localhost:8080/"/>
    <dc:contributor>Micard, Gabriel</dc:contributor>
    <dcterms:hasPart rdf:resource="https://kops.uni-konstanz.de/bitstream/123456789/41738/3/Micard_2-fko3dd2vu2z21.pdf"/>
    <dc:contributor>Terheiden, Barbara</dc:contributor>
    <bibo:uri rdf:resource="https://kops.uni-konstanz.de/handle/123456789/41738"/>
    <dcterms:abstract xml:lang="eng">The series resistance (R&lt;sub&gt;S&lt;/sub&gt;) of a solar cell, that influences fill factor and thus efficiency, is usually decomposed into individual components for development of optimization strategies. In this contribution we introduce a method to extract R&lt;sub&gt;s&lt;/sub&gt; of each part of the solar cell from TCAD simulation using free energy loss analysis. This method is particularly relevant for modern cell concepts where only TCAD simulation describes correctly high injection phenomena in lowly doped wafers, and where 2- or 3-dimensional carrier flow occurs (PERC, PERT, IBC) invalidating the classical analytical models for Rs description. We compare the lumped R&lt;sub&gt;S&lt;/sub&gt; value extracted from the FELA to the R&lt;sub&gt;S&lt;/sub&gt; extracted from the Multiple Light Intensity Method (MLIM) for IBC solar cells with various geometries and wafer doping levels, with and without a front surface field, and show that it is quite accurate even when high injection phenomena induce a slight underestimation of R&lt;sub&gt;S&lt;/sub&gt;.</dcterms:abstract>
    <dc:creator>Terheiden, Barbara</dc:creator>
    <dc:contributor>Hahn, Giso</dc:contributor>
    <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/>
    <dc:language>eng</dc:language>
    <dc:rights>terms-of-use</dc:rights>
    <dcterms:rights rdf:resource="https://rightsstatements.org/page/InC/1.0/"/>
    <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/>
  </rdf:Description>
</rdf:RDF>
Interner Vermerk
xmlui.Submission.submit.DescribeStep.inputForms.label.kops_note_fromSubmitter
Kontakt
URL der Originalveröffentl.
Prüfdatum der URL
Prüfungsdatum der Dissertation
Finanzierungsart
Kommentar zur Publikation
Allianzlizenz
Corresponding Authors der Uni Konstanz vorhanden
Internationale Co-Autor:innen
Universitätsbibliographie
Ja
Begutachtet
Diese Publikation teilen