Cyclotron resonance for two-dimensional electrons on thin helium films

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306_physrevB_2002.pdf
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2002
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Klier, Jürgen
Würl, Andreas
Mistura, Giampaolo
Shikin, Valeri
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Physical Review B. 2002, 65, 165428. Available under: doi: 10.1103/PhysRevB.65.165428
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We present a systematic investigation of the microwave absorption for two-dimensional electron layers on thin helium films and in the presence of a cyclotron resonance (CR) magnetic field. To explain the measured data, a recently proposed two-fraction structure of the electron system is used and here described in detail. Hereby the problem of substrate roughness, usually always present for electrons on thin helium films, is taken into account and it turns out to be an important parameter. Within this model the general structure of the microwave absorption becomes understandable and the fraction of localized and free electrons can be precisely determined. The details of the observed asymmetry and shift of the CR line shape are discussed.

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ISO 690KLIER, Jürgen, Andreas WÜRL, Paul LEIDERER, Giampaolo MISTURA, Valeri SHIKIN, 2002. Cyclotron resonance for two-dimensional electrons on thin helium films. In: Physical Review B. 2002, 65, 165428. Available under: doi: 10.1103/PhysRevB.65.165428
BibTex
@article{Klier2002Cyclo-8973,
  year={2002},
  doi={10.1103/PhysRevB.65.165428},
  title={Cyclotron resonance for two-dimensional electrons on thin helium films},
  volume={65},
  journal={Physical Review B},
  author={Klier, Jürgen and Würl, Andreas and Leiderer, Paul and Mistura, Giampaolo and Shikin, Valeri},
  note={Article Number: 165428}
}
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