Spectroscopic evidence for the tricapped trigonal prism structure of semiconductor clusters

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2000
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Müller, Jürgen
Liu, Bei
Shvartsburg, Alexandre A.
Ogut, Serdar
Chelikowsky, James R.
Siu, K. W. Michael
Ho, Kai-Ming
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Physical Review Letters. 2000, 85(8), pp. 1666-1669. Available under: doi: 10.1103/PhysRevLett.85.1666
Zusammenfassung

We have obtained photoelectron spectra (PES) for silicon cluster anions with up to 20 atoms. Efficient cooling of species in the source has allowed us to resolve multiple features in the PES for all sizes studied. Spectra for an extensive set of low-energy Sin- isomers found by a global search have been simulated using density functional theory and pseudopotentials. Except for n = 12, calculations for Sin- ground states agree with the measurements. This does not hold for other plausible geometries. Hence PES data validate the tricapped trigonal prism morphologies for medium-sized Si clusters.

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ISO 690MÜLLER, Jürgen, Bei LIU, Alexandre A. SHVARTSBURG, Serdar OGUT, James R. CHELIKOWSKY, K. W. Michael SIU, Kai-Ming HO, Gerd GANTEFÖR, 2000. Spectroscopic evidence for the tricapped trigonal prism structure of semiconductor clusters. In: Physical Review Letters. 2000, 85(8), pp. 1666-1669. Available under: doi: 10.1103/PhysRevLett.85.1666
BibTex
@article{Muller2000Spect-9475,
  year={2000},
  doi={10.1103/PhysRevLett.85.1666},
  title={Spectroscopic evidence for the tricapped trigonal prism structure of semiconductor clusters},
  number={8},
  volume={85},
  journal={Physical Review Letters},
  pages={1666--1669},
  author={Müller, Jürgen and Liu, Bei and Shvartsburg, Alexandre A. and Ogut, Serdar and Chelikowsky, James R. and Siu, K. W. Michael and Ho, Kai-Ming and Ganteför, Gerd}
}
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