The Helium Field Effect Transistor (II) : Gated Transport of Surface-State Electrons Through Micro-constrictions
The Helium Field Effect Transistor (II) : Gated Transport of Surface-State Electrons Through Micro-constrictions
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Date
2016
Authors
Shaban, Fatima
Ashari, Mohamed
Kono, Kimitoshi
Rees, David G.
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Journal of Low Temperature Physics ; 185 (2016), 3-4. - pp. 339-353. - ISSN 0022-2291. - eISSN 1573-7357
Abstract
We present transport measurements of surface-state electrons on liquid helium films in confined geometry. The measurements are taken using split-gate devices similar to a field effect transistor. The number of electrons passing between the source and drain areas of the device can be precisely controlled by changing the length of the voltage pulse applied to the gate electrode. We find evidence that the effective driving potential depends on electron–electron interactions, as well as the electric field applied to the substrate. Our measurements indicate that the mobility of electrons on helium films can be high and that microfabricated transistor devices allow electron manipulation on length scales close to the interelectron separation. Our experiment is an important step toward investigations of surface-state electron properties at much higher densities, for which the quantum melting of the system to a degenerate Fermi gas should be observed.
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530 Physics
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Helium field effect transistor, Surface electrons, Helium film, Electron transport, Confined geometry
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SHABAN, Fatima, Mohamed ASHARI, Thomas LORENZ, Richard RAU, Elke SCHEER, Kimitoshi KONO, David G. REES, Paul LEIDERER, 2016. The Helium Field Effect Transistor (II) : Gated Transport of Surface-State Electrons Through Micro-constrictions. In: Journal of Low Temperature Physics. 185(3-4), pp. 339-353. ISSN 0022-2291. eISSN 1573-7357. Available under: doi: 10.1007/s10909-016-1641-6BibTex
@article{Shaban2016-11Heliu-35157, year={2016}, doi={10.1007/s10909-016-1641-6}, title={The Helium Field Effect Transistor (II) : Gated Transport of Surface-State Electrons Through Micro-constrictions}, number={3-4}, volume={185}, issn={0022-2291}, journal={Journal of Low Temperature Physics}, pages={339--353}, author={Shaban, Fatima and Ashari, Mohamed and Lorenz, Thomas and Rau, Richard and Scheer, Elke and Kono, Kimitoshi and Rees, David G. and Leiderer, Paul} }
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