A circuit for measuring the gap voltage of a scanning tunneling microscope on a nanosecond time scale

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1999
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Ochmann, Michael
Münzer, Hans-Joachim
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Review of Scientific Instruments. 1999, 70(4), pp. 2049-2052. Available under: doi: 10.1063/1.1149709
Zusammenfassung

We demonstrate a new circuit design for fast measurements of the voltage drop across the gap of a scanning tunneling microscope (STM) based on the simultaneous operation of two different amplifiers. The first is a fast instrumentation amplifier, sensing directly the voltage drop across the tunneling barrier, the second is a medium speed current amplifier with an overall gain of 108 V/A, suitable for normal STM operation. We obtained a time resolution of 10 ns measuring the plasma ignition under a STM tip during illumination with an intense 10 ns laser pulse. Possible applications include the study of STM point contacts.

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ISO 690OCHMANN, Michael, Hans-Joachim MÜNZER, Johannes BONEBERG, Paul LEIDERER, 1999. A circuit for measuring the gap voltage of a scanning tunneling microscope on a nanosecond time scale. In: Review of Scientific Instruments. 1999, 70(4), pp. 2049-2052. Available under: doi: 10.1063/1.1149709
BibTex
@article{Ochmann1999circu-9114,
  year={1999},
  doi={10.1063/1.1149709},
  title={A circuit for measuring the gap voltage of a scanning tunneling microscope on a nanosecond time scale},
  number={4},
  volume={70},
  journal={Review of Scientific Instruments},
  pages={2049--2052},
  author={Ochmann, Michael and Münzer, Hans-Joachim and Boneberg, Johannes and Leiderer, Paul}
}
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