Nanostructuring on WSe2 with the atomic force microscope by a potential controlled electrochemical reaction

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182_applphyslett_1996.pdf
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1996
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Böhmisch, Mathias
Burmeister, Frank
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Applied Physical Letters. 1996, 69(13), pp. 1882-1884. Available under: doi: 10.1063/1.117465
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We present a method for the controlled fabrication of stable nanostructures under ambient conditions. The surfaces under consideration, WSe2, are imaged by an atomic force microscope. By applying a voltage between the tip and the sample, we can control an etching process at the surface: different voltage thresholds for the creation and the growth of structures of one monolayer (Se W Se) depth are observed. Our measurements on p-doped WSe2 strongly support an electrochemical corrosion reaction in a physisorbed water film. This method allows the in situ preparation and characterization of individual nanometer-sized structures on WSe2 and other metal dichalcogenides.

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ISO 690BÖHMISCH, Mathias, Frank BURMEISTER, Johannes BONEBERG, Paul LEIDERER, 1996. Nanostructuring on WSe2 with the atomic force microscope by a potential controlled electrochemical reaction. In: Applied Physical Letters. 1996, 69(13), pp. 1882-1884. Available under: doi: 10.1063/1.117465
BibTex
@article{Bohmisch1996Nanos-4824,
  year={1996},
  doi={10.1063/1.117465},
  title={Nanostructuring on WSe2 with the atomic force microscope by a potential controlled electrochemical reaction},
  number={13},
  volume={69},
  journal={Applied Physical Letters},
  pages={1882--1884},
  author={Böhmisch, Mathias and Burmeister, Frank and Boneberg, Johannes and Leiderer, Paul}
}
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