Quantification of Iron in Boron-Doped Silicon Solar Cells From Open Circuit Voltage Measurements
Dateien
Datum
Autor:innen
Herausgeber:innen
ISSN der Zeitschrift
Electronic ISSN
ISBN
Bibliografische Daten
Verlag
Schriftenreihe
Auflagebezeichnung
DOI (zitierfähiger Link)
Internationale Patentnummer
Angaben zur Forschungsförderung
Projekt
Open Access-Veröffentlichung
Sammlungen
Core Facility der Universität Konstanz
Titel in einer weiteren Sprache
Publikationstyp
Publikationsstatus
Erschienen in
Zusammenfassung
Iron is one of the most commonly encountered contaminants in crystalline silicon. The peculiarity of interstitial iron to form iron-boron pairs under certain circumstances reveals its presence because of different electrical activity of interstitial and paired iron, and allows the quantification of the contamination level. In this article, it is shown by means of simulations how the iron contamination level in solar cells can be estimated from changes in open circuit voltage. It is further elaborated how measurements at different illumination intensities can be used to determine the contamination level more accurately. Furthermore, the impact of various error sources is analyzed.
Zusammenfassung in einer weiteren Sprache
Fachgebiet (DDC)
Schlagwörter
Konferenz
Rezension
Zitieren
ISO 690
HERGUTH, Axel, 2022. Quantification of Iron in Boron-Doped Silicon Solar Cells From Open Circuit Voltage Measurements. In: IEEE Journal of Photovoltaics. IEEE. 2022, 12(4), pp. 937-947. ISSN 2156-3381. eISSN 2156-3403. Available under: doi: 10.1109/JPHOTOV.2022.3168134BibTex
@article{Herguth2022Quant-57568, year={2022}, doi={10.1109/JPHOTOV.2022.3168134}, title={Quantification of Iron in Boron-Doped Silicon Solar Cells From Open Circuit Voltage Measurements}, number={4}, volume={12}, issn={2156-3381}, journal={IEEE Journal of Photovoltaics}, pages={937--947}, author={Herguth, Axel} }
RDF
<rdf:RDF xmlns:dcterms="http://purl.org/dc/terms/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#" xmlns:foaf="http://xmlns.com/foaf/0.1/" xmlns:void="http://rdfs.org/ns/void#" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/server/rdf/resource/123456789/57568"> <foaf:homepage rdf:resource="http://localhost:8080/"/> <dc:contributor>Herguth, Axel</dc:contributor> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2022-05-18T11:25:37Z</dcterms:available> <dcterms:title>Quantification of Iron in Boron-Doped Silicon Solar Cells From Open Circuit Voltage Measurements</dcterms:title> <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/> <dcterms:issued>2022</dcterms:issued> <dc:creator>Herguth, Axel</dc:creator> <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/> <bibo:uri rdf:resource="https://kops.uni-konstanz.de/handle/123456789/57568"/> <dc:language>eng</dc:language> <dcterms:abstract xml:lang="eng">Iron is one of the most commonly encountered contaminants in crystalline silicon. The peculiarity of interstitial iron to form iron-boron pairs under certain circumstances reveals its presence because of different electrical activity of interstitial and paired iron, and allows the quantification of the contamination level. In this article, it is shown by means of simulations how the iron contamination level in solar cells can be estimated from changes in open circuit voltage. It is further elaborated how measurements at different illumination intensities can be used to determine the contamination level more accurately. Furthermore, the impact of various error sources is analyzed.</dcterms:abstract> <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/server/rdf/resource/123456789/41"/> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2022-05-18T11:25:37Z</dc:date> </rdf:Description> </rdf:RDF>