Erschienen in: 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference (2013 NSS/MIC) : Seoul, South Korea, 27 October - 2 November 2013; [in conjunction with the 20th International Workshop on Room-Temperature Semiconductor X-Ray and Gamma-Ray Detectors (RTSD)] ; 1. Piscataway, NJ: IEEE, 2013, pp. 194-199. IEEE Nuclear Science Symposium. 60. ISBN 978-1-4799-0532-4
