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Oener, Sebastian
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Oener, Sebastian
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Publication
Journal article
Infrared birefringence imaging of residual stress and bulk defects in multicrystalline silicon
(
2010
)
Ganapati, Vidya
;
Schoenfelder, Stephan
;
Castellanos, Sergio
;
Oener, Sebastian
;
Koepge, Ringo
;
Sampson, Aaron
;
Marcus, Matthew A.
;
Lai, Barry
;
Morhenn, Humphrey
;
Hahn, Giso
;
Bagdahn, Jörg
;
Buonassisi, Tonio
Published in: Journal of Applied Physics ; 108 (2010), 6. - 63528
(3.95 MB)
