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Influence of tip-sample interaction in a time-domain terahertz scattering near field scanning microscope

Influence of tip-sample interaction in a time-domain terahertz scattering near field scanning microscope

Type of Publication: Journal article
URI (citable link): http://nbn-resolving.de/urn:nbn:de:bsz:352-opus-75494
Author: Thoma, Arne; Dekorsy, Thomas
Year of publication: 2008
Published in: Applied Physics Letters ; 92 (2008). - 251103
DOI (citable link): https://dx.doi.org/10.1063/1.2949858
Summary:
Apertureless near field measurements with a metallic tip are performed in the terahertz frequency range. Lateral scans are recorded for different time delays within a terahertz pulse. The forward scattered terahertz signal strongly depends on the time delay. At larger time delays, the tip-sample interaction leads to additional structures in the scan that do not correspond to a change in topography or dielectric function.
Subject (DDC): 530 Physics
Link to License: In Copyright
Bibliography of Konstanz: Yes

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THOMA, Arne, Thomas DEKORSY, 2008. Influence of tip-sample interaction in a time-domain terahertz scattering near field scanning microscope. In: Applied Physics Letters. 92, 251103. Available under: doi: 10.1063/1.2949858

@article{Thoma2008Influ-9470, title={Influence of tip-sample interaction in a time-domain terahertz scattering near field scanning microscope}, year={2008}, doi={10.1063/1.2949858}, volume={92}, journal={Applied Physics Letters}, author={Thoma, Arne and Dekorsy, Thomas}, note={Article Number: 251103} }

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