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Electrical characterization of DNA in mechanically controlled break-junctions

Electrical characterization of DNA in mechanically controlled break-junctions

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KANG, Ning, Artur ERBE, Elke SCHEER, 2008. Electrical characterization of DNA in mechanically controlled break-junctions. In: New Journal of Physics. 10, 023030. Available under: doi: 10.1088/1367-2630/10/2/023030

@article{Kang2008Elect-9134, title={Electrical characterization of DNA in mechanically controlled break-junctions}, year={2008}, doi={10.1088/1367-2630/10/2/023030}, volume={10}, journal={New Journal of Physics}, author={Kang, Ning and Erbe, Artur and Scheer, Elke}, note={Article Number: 023030} }

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