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Thickness dependence of ferromagnetic- and metal-insulator transition in thin EuO films

Thickness dependence of ferromagnetic- and metal-insulator transition in thin EuO films

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MÜLLER, Martina, Guo-Xing MIAO, Jagadeesh S. MOODERA, 2009. Thickness dependence of ferromagnetic- and metal-insulator transition in thin EuO films. In: Journal of Applied Physics. American Institute of Physics AIP). 105(7), 07C917. ISSN 0021-8979. eISSN 1089-7550. Available under: doi: 10.1063/1.3063673

@article{Muller2009-04Thick-49739, title={Thickness dependence of ferromagnetic- and metal-insulator transition in thin EuO films}, year={2009}, doi={10.1063/1.3063673}, number={7}, volume={105}, issn={0021-8979}, journal={Journal of Applied Physics}, author={Müller, Martina and Miao, Guo-Xing and Moodera, Jagadeesh S.}, note={Article Number: 07C917} }

Thickness dependence of ferromagnetic- and metal-insulator transition in thin EuO films Miao, Guo-Xing Miao, Guo-Xing 2009-04 Moodera, Jagadeesh S. Moodera, Jagadeesh S. Müller, Martina Müller, Martina 2020-05-29T07:43:12Z eng 2020-05-29T07:43:12Z We have studied the thickness dependence of the magnetic and transport properties of thin EuO films in the range of 10–60 Å. The ferromagnetic phase transition shows a systematic dependence of the critical temperature T<sub>c</sub> with decreasing EuO film thickness. This behavior has been attributed to the interface layers which play a major role by reducing the number of average magnetic neighbors; we find the effect of interface intermixing becoming relevant in low thickness regime. In addition, we could identify a clear dependence of the onset of the metal-to-insulator transition on the ferromagnetic ordering of thin EuO films. terms-of-use

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