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Breaking resolution limits in ultrafast electron diffraction and microscopy

Breaking resolution limits in ultrafast electron diffraction and microscopy

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BAUM, Peter, Ahmed H. ZEWAIL, 2006. Breaking resolution limits in ultrafast electron diffraction and microscopy. In: Proceedings of the National Academy of Sciences of the United States of America. 103(44), pp. 16105-16110. ISSN 0027-8424. eISSN 1091-6490. Available under: doi: 10.1073/pnas.0607451103

@article{Baum2006-10-31Break-43302, title={Breaking resolution limits in ultrafast electron diffraction and microscopy}, year={2006}, doi={10.1073/pnas.0607451103}, number={44}, volume={103}, issn={0027-8424}, journal={Proceedings of the National Academy of Sciences of the United States of America}, pages={16105--16110}, author={Baum, Peter and Zewail, Ahmed H.} }

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