KOPS - The Institutional Repository of the University of Konstanz

Breaking resolution limits in ultrafast electron diffraction and microscopy

Breaking resolution limits in ultrafast electron diffraction and microscopy

Cite This

Files in this item

Files Size Format View

There are no files associated with this item.

BAUM, Peter, Ahmed H. ZEWAIL, 2006. Breaking resolution limits in ultrafast electron diffraction and microscopy. In: Proceedings of the National Academy of Sciences of the United States of America. 103(44), pp. 16105-16110. ISSN 0027-8424. eISSN 1091-6490. Available under: doi: 10.1073/pnas.0607451103

@article{Baum2006-10-31Break-43302, title={Breaking resolution limits in ultrafast electron diffraction and microscopy}, year={2006}, doi={10.1073/pnas.0607451103}, number={44}, volume={103}, issn={0027-8424}, journal={Proceedings of the National Academy of Sciences of the United States of America}, pages={16105--16110}, author={Baum, Peter and Zewail, Ahmed H.} }

<rdf:RDF xmlns:dcterms="http://purl.org/dc/terms/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dspace="http://digital-repositories.org/ontologies/dspace/0.1.0#" xmlns:foaf="http://xmlns.com/foaf/0.1/" xmlns:void="http://rdfs.org/ns/void#" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/43302"> <dc:contributor>Baum, Peter</dc:contributor> <void:sparqlEndpoint rdf:resource="http://localhost/fuseki/dspace/sparql"/> <foaf:homepage rdf:resource="http://localhost:8080/jspui"/> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2018-09-18T11:02:45Z</dcterms:available> <dcterms:issued>2006-10-31</dcterms:issued> <dc:language>eng</dc:language> <dc:creator>Baum, Peter</dc:creator> <dcterms:isPartOf rdf:resource="https://kops.uni-konstanz.de/rdf/resource/123456789/41"/> <dcterms:abstract xml:lang="eng">Ultrafast electron microscopy and diffraction are powerful techniques for the study of the time-resolved structures of molecules, materials, and biological systems. Central to these approaches is the use of ultrafast coherent electron packets. The electron pulses typically have an energy of 30 keV for diffraction and 100-200 keV for microscopy, corresponding to speeds of 33-70% of the speed of light. Although the spatial resolution can reach the atomic scale, the temporal resolution is limited by the pulse width and by the difference in group velocities of electrons and the light used to initiate the dynamical change. In this contribution, we introduce the concept of tilted optical pulses into diffraction and imaging techniques and demonstrate the methodology experimentally. These advances allow us to reach limits of time resolution down to regimes of a few femtoseconds and, possibly, attoseconds. With tilted pulses, every part of the sample is excited at precisely the same time as when the electrons arrive at the specimen. Here, this approach is demonstrated for the most unfavorable case of ultrafast crystallography. We also present a method for measuring the duration of electron packets by autocorrelating electron pulses in free space and without streaking, and we discuss the potential of tilting the electron pulses themselves for applications in domains involving nuclear and electron motions.</dcterms:abstract> <dspace:isPartOfCollection rdf:resource="https://kops.uni-konstanz.de/rdf/resource/123456789/41"/> <dc:contributor>Zewail, Ahmed H.</dc:contributor> <dcterms:title>Breaking resolution limits in ultrafast electron diffraction and microscopy</dcterms:title> <bibo:uri rdf:resource="https://kops.uni-konstanz.de/handle/123456789/43302"/> <dc:creator>Zewail, Ahmed H.</dc:creator> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2018-09-18T11:02:45Z</dc:date> </rdf:Description> </rdf:RDF>

This item appears in the following Collection(s)

Search KOPS


Browse

My Account