All-optical control and metrology of electron pulses

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KEALHOFER, Catherine, Waldemar SCHNEIDER, Dominik EHBERGER, Andrey RYABOV, Ferenc KRAUSZ, Peter BAUM, 2016. All-optical control and metrology of electron pulses. In: Science. 352(6284), pp. 429-433. ISSN 0036-8075. eISSN 1095-9203. Available under: doi: 10.1126/science.aae0003

@article{Kealhofer2016-04-22Allop-43256, title={All-optical control and metrology of electron pulses}, year={2016}, doi={10.1126/science.aae0003}, number={6284}, volume={352}, issn={0036-8075}, journal={Science}, pages={429--433}, author={Kealhofer, Catherine and Schneider, Waldemar and Ehberger, Dominik and Ryabov, Andrey and Krausz, Ferenc and Baum, Peter} }

terms-of-use 2018-09-13T10:31:40Z Kealhofer, Catherine Short electron pulses are central to time-resolved atomic-scale diffraction and electron microscopy, streak cameras, and free-electron lasers. We demonstrate phase-space control and characterization of 5-picometer electron pulses using few-cycle terahertz radiation, extending concepts of microwave electron pulse compression and streaking to terahertz frequencies. Optical-field control of electron pulses provides synchronism to laser pulses and offers a temporal resolution that is ultimately limited by the rise-time of the optical fields applied. We used few-cycle waveforms carried at 0.3 terahertz to compress electron pulses by a factor of 12 with a timing stability of <4 femtoseconds (root mean square) and measure them by means of field-induced beam deflection (streaking). Scaling the concept toward multiterahertz control fields holds promise for approaching the electronic time scale in time-resolved electron diffraction and microscopy. Schneider, Waldemar All-optical control and metrology of electron pulses Baum, Peter Krausz, Ferenc 2016-04-22 Ryabov, Andrey Ehberger, Dominik Krausz, Ferenc Ryabov, Andrey 2018-09-13T10:31:40Z Baum, Peter eng Ehberger, Dominik Kealhofer, Catherine Schneider, Waldemar

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