Diffraction and microscopy with attosecond electron pulse trains

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MORIMOTO, Yuya, Peter BAUM, 2018. Diffraction and microscopy with attosecond electron pulse trains. In: Nature Physics. 14(3), pp. 252-256. ISSN 1745-2473. eISSN 1745-2481. Available under: doi: 10.1038/s41567-017-0007-6

@article{Morimoto2018-03Diffr-43225, title={Diffraction and microscopy with attosecond electron pulse trains}, year={2018}, doi={10.1038/s41567-017-0007-6}, number={3}, volume={14}, issn={1745-2473}, journal={Nature Physics}, pages={252--256}, author={Morimoto, Yuya and Baum, Peter} }

Diffraction and microscopy with attosecond electron pulse trains Attosecond spectroscopy<sup>1–7</sup> can resolve electronic processes directly in time, but a movie-like space–time recording is impeded by the too long wavelength (~100 times larger than atomic distances) or the source–sample entanglement in re-collision techniques<sup>8–11</sup>. Here we advance attosecond metrology to picometre wavelength and sub-atomic resolution by using free-space electrons instead of higher-harmonic photons<sup>1–7</sup> or re-colliding wavepackets<sup>8–11</sup>. A beam of 70-keV electrons at 4.5-pm de Broglie wavelength is modulated by the electric field of laser cycles into a sequence of electron pulses with sub-optical-cycle duration. Time-resolved diffraction from crystalline silicon reveals a < 10-as delay of Bragg emission and demonstrates the possibility of analytic attosecond–ångström diffraction. Real-space electron microscopy visualizes with sub-light-cycle resolution how an optical wave propagates in space and time. This unification of attosecond science with electron microscopy and diffraction enables space–time imaging of light-driven processes in the entire range of sample morphologies that electron microscopy can access. eng Baum, Peter Morimoto, Yuya terms-of-use 2018-09-11T10:57:08Z Baum, Peter 2018-03 2018-09-11T10:57:08Z Morimoto, Yuya

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