High-fidelity quantum gates in Si/SiGe double quantum dots

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RUSS, Maximilian, David M. ZAJAC, Anthony J. SIGILLITO, Felix BORJANS, Jacob M. TAYLOR, Jason R. PETTA, Guido BURKARD, 2018. High-fidelity quantum gates in Si/SiGe double quantum dots. In: Physical Review B. 97(8), 085421. ISSN 2469-9950. eISSN 2469-9969. Available under: doi: 10.1103/PhysRevB.97.085421

@article{Russ2018Highf-41584, title={High-fidelity quantum gates in Si/SiGe double quantum dots}, year={2018}, doi={10.1103/PhysRevB.97.085421}, number={8}, volume={97}, issn={2469-9950}, journal={Physical Review B}, author={Russ, Maximilian and Zajac, David M. and Sigillito, Anthony J. and Borjans, Felix and Taylor, Jacob M. and Petta, Jason R. and Burkard, Guido}, note={Article Number: 085421} }

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