Type of Publication: | Journal article |
Publication status: | Published |
URI (citable link): | http://nbn-resolving.de/urn:nbn:de:bsz:352-0-410596 |
Author: | Helden, Laurent; Eremina, Elena; Riefler, Norbert; Hertlein, Christopher; Bechinger, Clemens; Eremin, Yuri; Wriedt, Thomas |
Year of publication: | 2006 |
Published in: | Applied Optics ; 45 (2006), 28. - pp. 7299-7308. - ISSN 0003-6935. - eISSN 1539-4522 |
DOI (citable link): | https://dx.doi.org/10.1364/AO.45.007299 |
Summary: |
We simulate and measure light scattering of a micrometer-sized spherical particle suspended in solution close to a glass substrate. The model, based on the discrete sources method, is developed to describe the experimental situation of total internal reflection microscopy experiments; i.e., the particle is illuminated by an evanescent light field originating from the glass–solvent interface. In contrast to the well-established assumption of a simple exponential decay of the scattering intensity with distance, we demonstrate significant deviations for a certain range of penetration depths and polarization states of the incident light.
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Subject (DDC): | 530 Physics |
Link to License: | In Copyright |
HELDEN, Laurent, Elena EREMINA, Norbert RIEFLER, Christopher HERTLEIN, Clemens BECHINGER, Yuri EREMIN, Thomas WRIEDT, 2006. Single-particle evanescent light scattering simulations for total internal reflection microscopy. In: Applied Optics. 45(28), pp. 7299-7308. ISSN 0003-6935. eISSN 1539-4522. Available under: doi: 10.1364/AO.45.007299
@article{Helden2006-10-01Singl-39212, title={Single-particle evanescent light scattering simulations for total internal reflection microscopy}, year={2006}, doi={10.1364/AO.45.007299}, number={28}, volume={45}, issn={0003-6935}, journal={Applied Optics}, pages={7299--7308}, author={Helden, Laurent and Eremina, Elena and Riefler, Norbert and Hertlein, Christopher and Bechinger, Clemens and Eremin, Yuri and Wriedt, Thomas} }
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