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Capacitance-voltage spectroscopy and analysis of dielectric intrinsic amorphous silicon thin films

Capacitance-voltage spectroscopy and analysis of dielectric intrinsic amorphous silicon thin films

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GERKE, Sebastian, Gabriel MICARD, Reinhart JOB, Giso HAHN, Barbara TERHEIDEN, 2016. Capacitance-voltage spectroscopy and analysis of dielectric intrinsic amorphous silicon thin films. In: Physica Status Solidi (C). 13(10-12), pp. 724-728. ISSN 1610-1634. eISSN 1610-1642. Available under: doi: 10.1002/pssc.201600019

@article{Gerke2016-12Capac-36087, title={Capacitance-voltage spectroscopy and analysis of dielectric intrinsic amorphous silicon thin films}, year={2016}, doi={10.1002/pssc.201600019}, number={10-12}, volume={13}, issn={1610-1634}, journal={Physica Status Solidi (C)}, pages={724--728}, author={Gerke, Sebastian and Micard, Gabriel and Job, Reinhart and Hahn, Giso and Terheiden, Barbara} }

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