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Fundamental quantum noise mapping with tunnelling microscopes tested at surface structures of subatomic lateral size

Fundamental quantum noise mapping with tunnelling microscopes tested at surface structures of subatomic lateral size

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HERZ, Markus, Samuel BOUVRON, Elizabeta CAVAR, Mikhail FONIN, Wolfgang BELZIG, Elke SCHEER, 2013. Fundamental quantum noise mapping with tunnelling microscopes tested at surface structures of subatomic lateral size. In: Nanoscale. 5(20), pp. 9978-9983. ISSN 2040-3364. eISSN 2040-3372

@article{Herz2013-10-21Funda-24367, title={Fundamental quantum noise mapping with tunnelling microscopes tested at surface structures of subatomic lateral size}, year={2013}, doi={10.1039/c3nr02216a}, number={20}, volume={5}, issn={2040-3364}, journal={Nanoscale}, pages={9978--9983}, author={Herz, Markus and Bouvron, Samuel and Cavar, Elizabeta and Fonin, Mikhail and Belzig, Wolfgang and Scheer, Elke} }

<rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:bibo="http://purl.org/ontology/bibo/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:xsd="http://www.w3.org/2001/XMLSchema#" > <rdf:Description rdf:about="https://kops.uni-konstanz.de/rdf/resource/123456789/24367"> <dc:rights>deposit-license</dc:rights> <dc:contributor>Herz, Markus</dc:contributor> <dc:contributor>Belzig, Wolfgang</dc:contributor> <dcterms:issued>2013-10-21</dcterms:issued> <dc:contributor>Cavar, Elizabeta</dc:contributor> <dcterms:title>Fundamental quantum noise mapping with tunnelling microscopes tested at surface structures of subatomic lateral size</dcterms:title> <dcterms:rights rdf:resource="http://nbn-resolving.org/urn:nbn:de:bsz:352-20140905103605204-4002607-1"/> <dc:creator>Scheer, Elke</dc:creator> <dc:contributor>Fonin, Mikhail</dc:contributor> <dc:contributor>Bouvron, Samuel</dc:contributor> <dc:creator>Cavar, Elizabeta</dc:creator> <dc:date rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2013-09-06T14:29:20Z</dc:date> <bibo:uri rdf:resource="http://kops.uni-konstanz.de/handle/123456789/24367"/> <dcterms:abstract xml:lang="eng">We present a measurement scheme that enables quantitative detection of the shot noise in a scanning tunnelling microscope while scanning the sample. As test objects we study defect structures produced on an iridium single crystal at low temperatures. The defect structures appear in the constant current images as protrusions with curvature radii well below the atomic diameter. The measured power spectral density of the noise is very near to the quantum limit with Fano factor F = 1. While the constant current images show detailed structures expected for tunnelling involving d-atomic orbitals of Ir, we find the current noise to be without pronounced spatial variation as expected for shot noise arising from statistically independent events.</dcterms:abstract> <dc:creator>Fonin, Mikhail</dc:creator> <dcterms:bibliographicCitation>Nanoscale ; 5 (2013), 20. - S. 9978-9983</dcterms:bibliographicCitation> <dc:contributor>Scheer, Elke</dc:contributor> <dcterms:available rdf:datatype="http://www.w3.org/2001/XMLSchema#dateTime">2013-09-06T14:29:20Z</dcterms:available> <dc:creator>Herz, Markus</dc:creator> <dc:creator>Bouvron, Samuel</dc:creator> <dc:language>eng</dc:language> <dc:creator>Belzig, Wolfgang</dc:creator> </rdf:Description> </rdf:RDF>

Dateiabrufe seit 01.10.2014 (Informationen über die Zugriffsstatistik)

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